August 13-14, 2008 • The Fashion Institute of Technology • New York City

Attendee Testimonials

What past attendees had to say about the event:

"Finally an RFID conference specific to our industry, found it very informative."
          ~Marks Work Warehouse

"Informative & proved a good overview of the industry, its direction and some future developments."
           ~ Glen Sets – SML Group LTD.

"You took what could be "boring" or "overwhelming" and put together a varied program to keep it interesting."
          ~Mary Delaney – Checkpoint Systems

"It was very informative.  The available to speak with booth reps were invaluable.  Conference was run in a timely matter and very professional."
          ~Paul Yoo – L&E International, LTD.

"Very well organized, nice blend of panel discussions coupled with presentations."
          ~ Brian O’Donnell – Liz Claiborne Inc.

"Very Informative, even if I didn’t agree with the findings, results of pilots, etc. it was essential to here the alternative points of view"
          ~ Joel Feldman – Byer California

"This will be my third year attending. I really like the event because of the networking opportunities and the news about what is happening in the market."
          ~ Goetz Pfeifferling – Lemmi Fashion


See Complete Agenda »

RFID Journal — RFID in Fashion is produced by RFID Journal, in partnership with the American Apparel & Footwear Association.



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