Michael Liard
VP of Auto-ID and Data Capture, VDC Research

As VDC's VP of Auto-ID and Data Capture on all proprietary research and consulting engagements involving automatic identification, Michael Liard has covered the auto-ID industry, including research and analysis, for bar-code, RFID, contactless, NFC and RTLS technologies for more than a decade. Previously, he was the practice director of RFID at ABI Research. Mr. Liard was presented the Excellence in Journalism Award by AIM Global in 2011.